The Institute of Optoelectronic Technology, Chinese Academy of Sciences, is engaged in the research of advanced coating technology and actively explores the beam propagation characteristics in the novel film system. It uses negative refractive index materials to regulate the optical Tamm state and Photon's Anderson. A series of advances have been made in the direction of Optical Localization (Optical Anderson localization). The relevant results were published in Optics Express, an optical journal. The first author of the paper was Ph.D., a postdoctoral fellow of Optoelectronics, and Liu Cunding, an assistant researcher.
A negative-refractive-index material is an artificially prepared material with novel optical properties. This material has both a negative permittivity and a magnetic permeability. When light is incident on a negative-refractive medium interface from a conventional material (positive-refractive index medium) A negative refraction occurs. The refracted ray and incident ray are on the same side of the interface normal. Negative refractive media change the traditional understanding of light wave propagation. Because of its unique and novel physical properties and attractive application prospects, negative refraction media has attracted wide attention from the international academic community. In recent years, negative refractive index material processing and preparation technology has made great progress. Research on negative refractive index materials for optical films The influence of nature is of great significance for the future processing of special optical thin-film devices.
First, the researchers introduced a negative-refractive-index material into the metal-reflective film structure and found that the negative-refractive-index material modulates the optical Tamm-state dispersion relationship at the metal-reflective film interface to produce an optical exciton with a negative group velocity. Negative group velocity optical excitons have important references in fields such as information transmission. The researchers further adjusted the thickness of the negative-refractive-index material film (Figure 1) and found that the negative group-rate photon exciton generation conditions are closely related to the light energy propagation direction and the average energy density, only when the light's energy propagation direction and the system's average energy When the density is the opposite, the negative beam propagation group velocity appears.
The researchers further developed the study of photon transport characteristics in the optical thin film system due to the refractive index disorder in the negative refractive index layer. They selected the positive and negative refractive index materials so that the photon transmission was completely transparent in the absence of disorder, and then The disorder of refractive index was introduced into the system, and the localization characteristics of photons in different structures such as photonic crystal and photonic quasicrystal were studied. It was found that when the mean value of the refractive index in the multi-layer thin film system is zero, abnormal Anderson localization appears in the refractive index disorder system, and its local length metric parameter is closely related to the structure of the thin film, as shown in Figure 2. Show. This research has an important role in improving the beam propagation performance in optical thin film systems and has potential applications in solar cells and other fields. The research results are published in the Optics Express column.
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